Mie scattering is a phenomenon that happens when an electromagnetic wave (light) is scattered by a particle which has the same size of the particle comparable with the incident light wavelength. This non-destructive scattering technique is recently used in the various study as an alternative for measuring particle size distribution in contrast with other methods which has certain limits (i.e. destructive to the samples). The parameter observed in the Mie scattering experiment is a function of the Mie scattering intensity to the angle. This research aims to analyze the particle distribution effect of the Mie scattering phenomena experimentally via image processing technique as a preliminary study in particle size analyzer development. The nanoparticles samples that have been used to do this research are polystyrene latex with an average size of a particle of 108 nm, and Fumonisin B1 with an average size of a particle of 36.4 nm. The result of the experiment from those two types of samples was the plot of color intensity extracted from the image (photo) at varied scattering angles. The graph of scattering intensity of polystyrene sample with the average size of 108 nm has a peak value higher than sample Fumonisin B1 with an average size of 36.4 nm. Generally, the light has been scattered weaker at Fumonisin B1 samples compared to polystyrene latex nanoparticles samples.